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S-parameter measurements

Maury Microwave

S-Parameters and VNA Calibration

Scattering parameters, or S-parameters, quantify how electrical signals propagate through a linear network. Comprising reflection and transmission coefficients, S-parameters reveal signal behavior at ports, aiding in circuit design and analysis. They define power flow, impedance matching, and signal integrity in high-frequency applications like microwave circuits.

Vector Network Analyzer (VNA) calibration is a process to enhance measurement accuracy by accounting for systematic errors in the test setup. Calibration involves applying known standards, like open, short, and load, to establish reference points, compensating for cables and connectors, ensuring accurate measurements of device characteristics such as S-parameters, and improving overall measurement reliability.

S-Parameter Measurement Uncertainty

S-parameter measurement uncertainty refers to the potential errors or inaccuracies in the determination of scattering parameters (S-parameters) in a network. It encompasses factors like calibration uncertainties, environmental conditions, and equipment limitations. Understanding and quantifying these uncertainties are crucial for assessing the reliability and confidence in the measured S-parameter values, aiding accurate interpretation in fields such as RF and microwave engineering.

Through an expanded error model, the individual contributors to measurement uncertainty can be quantified and represented graphically as potential errors surrounding the measured S-parameters.

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Improving Calibration Accuracy and Speed with Characterized Calibration Standards
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Application Notes

Characterizing Uncertainty in S-Parameter Measurements
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