Applications

High Speed Tuning Vector Receiver Load Pull Measurements Large Signal Analysis, Nonlinear VNA Measurements and Behavioral Model Extraction Linear and Nonlinear Compact Modeling Pre-RF Pulsed IV Measurements for Enhanced Transistor Compact Modeling Noise Figure / Noise Parameter Measurements Active Load Pull and Hybrid-Active Load Pull Measurements Active Wideband-Impedance Load Pull Measurements for 4G, 5G and WLAN Signals mmW and Sub-THz 50Ω Gain Compression and Active Load Pull Measurements Mobile Phone Testing Under Real-World Conditions Amplifier Stability and Ruggedness Testing On-Wafer Production Testing Stability Analysis of Microwave Circuits

Products

IVCAD Advanced Measurement and Modeling Software (MT930 series) ATS Automated Tuner Software (MT993 series) IQSTAR Circuit Measurement and Analysis Software (IQS series) MMW-STUDIO mmW and Sub-THz Characterization Software (MT920 series) AMTS Automated Mobile Test Software (MT910 series) Mixed-Signal Active Load Pull System (MT1000 and MT2000 series) MTUNE Tuner Characterization and Control Software Automated Tuners / Impedance Tuners / Load Pull Tuners Manual Tuners / Impedance Tuners Pulsed IV Systems (AM3200-series) Pulsed SMU Systems (AM3100-series) Noise Receiver Modules (MT7553 series) Transistor Test Fixtures (MT964 series) Low Loss Couplers (LLC series) Precision Low-Loss Multiplexers (DP/TP series) High-Power Low-Loss Pulsed Bias Tees (MBT series) High-Resolution Current Probes (AVCP series) Harmonic Phase References (HPR series)

Products

Insight Calibration & Measurement Software VNA Calibration Kits Verification Kits Coaxial Calibration Standards Waveguide Calibration Standards Metrology Torque Wrenches Connector Gage Kits Noise Calibration Systems and Accessories Stub Tuners

Services

VNA Cal Kit Verification and Calibration Torque Wrench Calibration Warranty & Service

Products

Adapters
Calibration-Grade (Metrology) Adapters
ColorConnect™ Precision Adapters
Test Essentials™ Lab Adapters
Quick Test Push-On Adapters
Cable Assemblies
StabilityVNA™ Test Port Cable Assemblies
StabilityPlus™ Cable Assemblies
StabilityPlus™ Low Profile Cable Assemblies
StabilityFlex™ Cable Assemblies
StabilityWafer™ Cable Assemblies
StabilityTVAC™ Cable Assemblies
Attenuators TW-series Torque Wrenches Connector Gage Kits

Services

Automated Impedance Tuner Startup Assistance System Integration Services Measurement Services System-Level Verification Devices and Device Characterization Services Rental, Lease, Finance Services VNA Cal Kit Calibration Torque Wrench Calibration Warranty Service

Resources

Application Notes Library Videos
Products and Solutions Overview
Software Overview
Best Practices and Tips-and-Tricks
Seminars and Webinars
Files
Software Download Site
VNA Cal Kit Files
RF Calculator

Pulsed-Bias Pulsed-RF Harmonic Load Pull for GaN and WBG Devices

Introduction

Wide Band-Gap devices, such as GaN offer several advantages over GaAs, including higher operating voltage (over 100V breakdown), higher operating temperature (over 150°C channel temperature), and higher power density (5-30W/mm). Despite these obvious advantages, the large output power capability presents a great deal of heat dissipation. SiC has an impressive thermal conductivity, but for large periphery GaN devices, it is not sufficient for eliminating thermal effects. GaN HEMTs can also suffer from the effects of trapping in the surface passivation along the gate width.

Pulsed Measurements

Because GaN devices tend to self-heat and are susceptible to trapping effects, it is important to pulse voltages between a quiescent and hot value and define appropriate pulse-widths. Pulsing the voltage will result in a lower average power being delivered to the device and reduced self-heating. Such a measurement allows for near-isothermal performance.

Pulsed-Bias Pulsed-RF Harmonic Load Pull for GaN and WBG Devices

Pulsed Load Pull

Load pull consists of varying or "pulling" the load impedance seen by a device-under-test (DUT) while measuring its performance under actual operating conditions. This method is important for large signal, nonlinear devices where the operating parameters may change with power level or impedance. Because the device will operate differently under DC and pulsed- bias conditions, a difference in load pull contours is expected. Since commercial and military pulsed applications are being considered, the load pull setup and results should perfectly describe the application.

Many higher-power GaN devices have source impedances around or below 1-3Ω because of their large peripheries. Achieving these impedances at the DUT reference plane (taking into account the losses of a fixture, adapters, cabling, probes...) requires a tuner, or a combination of tuners, capable of presenting a VSWR in the range of 100:1 - 200:1. Load matching requirements are not as high due to the output geometry of the device designed specifically for higher current operation, and a 15:1 - 20:1 VSWR is often enough to meet matching requirements.

Pulsed Load Pull

Tour IVCAD Software Suite

IVCAD advanced measurement and modeling software, offered by Maury Microwave and AMCAD Engineering supports multiple load pull techniques including traditional load pull using external instrumentation, VNA-based load pull, active load pull and hybrid load pull. It performs DC-IV and pulsed-IV measurements and incorporates device modeling tools. Its modern visualization capabilities give users a greater ability to view, plot and graph measurement data in an intuitive manner.

Learn more about how we can help you reach your goals


[ CLOSE ]

Need information regarding Pulsed-Bias Pulsed-RF Harmonic Load Pull for GaN and WBG Devices?

Fill out the form below and a specialist will contact you.







* denotes 'required' fields.

Application Notes and Data Sheets

5A-043

Pulsed-Bias Pulsed-RF Harmonic Load Pull for GaN and WBG Devices 5A-043

Maury Application Notes Library

Maury Software and System Application Notes. Maury Application Notes Library