Noise Figure / Noise Parameter Measurements


Noise occurs naturally in any active device or circuit, and limits the minimum levels of useful signals. With a cell phone, for example, it can interfere with a weak signal, and interrupt a call. Therefore, it is important to design circuits to minimize the effects of noise. To do this, the noise must be quantified and measured in the form of noise parameters, comprised of Fmin, Gamma,opt (mag and phase), and Rn.

An impedance tuner is often used in conjunction with a noise figure analyzer (or alternate noise measurement instrument) to measure the noise figure, or noise power, as a function of source impedance presented to the DUT, from which the Noise Parameters are extracted.

Note, the term Noise Figure is a commonly referenced parameter when discussing LNAs, and most often refers to the 50ohm noise contribution of a device. The 50ohm Noise Figure of a device can be directly measured using the Noise Parameter system, or extrapolated from the Noise Figure contours. Direct measurement is achieved by using an impedance tuner to present exactly 50ohm to the DUT and measuring the associated noise figure (note, the tuner can correct for the non-50ohm system impedance normally presented without a tuner). Noise Figure extrapolation is a standard function within a noise parameter measurement system and uses mathematically determined contours to calculate the expected Noise Figure contribution at 50ohm.

Noise Figure / Noise Parameter Measurements

Ultra-Fast Noise Parameters

A new ultra-fast noise parameter measurement method is able to improve overall calibration and measurement time by a factor of 100X-400X, bringing measurements that could once take tens or hundreds of hours to tens of minutes. The new method has two key features that contribute to the breakthrough speed improvement: 1) The tuner is characterized with one set of states (physical tuner positions) that are selected to give a reasonable impedance spread over the frequency band of interest; and 2) the noise power measurement is swept over the frequency range at each state, so that the tuner only moves to each position once. This takes advantage of the fast sweep capability of modern instruments, as well as saving time by minimizing tuner movement.

The new noise parameter measurement method provides two orders of magnitude speed improvement. It also produces data that is smoother and has less scatter than the traditional method. The fast measurement speed eliminates temperature drift, and using a VNA with an internal noise receiver simplifies the setup and makes it much more stable and consistent. The much higher speed makes it practical to always do a full in-situ calibration to minimize errors, and to measure more frequencies to get a better view of scatter and cyclical errors, and to be able to use smoothing with more confidence. The higher frequency density also enhances accuracy by reducing shifts due to aliasing.


Ultra-Fast Noise Parameters

PNA-X 029 Noise Parameter Measurements

More information regarding Noise Parameter measurements with Agilent Technologies' N5245A-series PNA-X with Noise option 029 can be found here.

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Application Notes and Data Sheets


A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy 5A-042


Using an Impedance Tuner and Noise Receiver Module to Extend the Agilent PNA-X to 50 GHz Noise Parameters 5C-085

Maury Application Notes Library

Maury Software and System Application Notes. Maury Application Notes Library