MMW-STUDIO mmW and Sub-THz characterization software, offered by Maury Microwave and Vertigo Technologies, is a software suite designed to work with a 4-port VNA using waveguide extender modules and add accurate and repeatable high-resolution power control. The software enables the direct measurement of vector corrected power at the DUT reference plane, as well as control over the power delivered to the DUT. Doing so allows engineers to perform gain compression power sweep measurements over the available level of powers, and to perform S-parameter measurements at any arbitrary power level.
MMW-STUDIO LP is a software add-on, which when used in conjunction with a Vector Modulation Unit (VMU), enables control over the magnitude and phase of the signals delivered to the input and output of the DUT. This enables an engineer to set arbitrary impedances, or perform active load pull measurements, where the magnitude of reflection presented to the DUT is achieved by controlling the reflected a2 wave and fulfilling Γ=a2/b2.
Features and Benefits
Measure S-parameters at user-specified power level
High-resolution power control for accurate and repeatable vector-corrected 50Ω gain compression power sweep measurements
Arbitrary impedance control / active load pull
Measure fundamental powers (Pin, Pav, Pload), gain and efficiency at 50Ω and arbitrary impedances
Advanced measurement sequencer sweeps impedance, power, frequency and bias
Calibrated measurements at DUT reference plane
Supports most commercial waveguide extenders up to 1.1 THz
MMW-STUDIO Software Suite Models
High-resolution power control for S-parameters and gain compression power sweep measurements
Active load pull at mmW and sub-THz frequencies add-on
Standalone data display
Learn more about how we can help you reach your goals
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Application Notes and Data Sheets
ARFTG 2015 Technical Paper
Power Control for S-parameters and Large Signal Characterization at(sub)-mmWave frequencies
ARFTG 2016 Technical Paper
Power Level Control of mm-Wave Test Benches for Accurate Small and Large-signal DUT Measurements