Technology Fair Demonstration Webinar Registration

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We would like to thank everyone that participated in our live Technology Fair Demonstrations and Virtual IMS 2021. The event is now over.

The source material for the demonstrations are avilable on Maury's YouTube channel in the Seminars playlist.



Session 1: An Introduction to Impedance Tuners

Speaker
John Dominguez, Maury Microwave

Summary
Load Pull is the act of presenting a set of controlled impedances to a device under test (DUT) and measuring a set of parameters at each point. By varying the impedance, it is possible to fully characterize the performance of a DUT. The most common tool used to vary the impedance presented to a DUY is the passive impedance tuner. While the fundamental principles of passive impedance tuning haven’t changed significantly since their earliest conception, today’s state-of-the-art automated impedance tuners have improved accuracy and repeatability, are orders of magnitude faster, allow for direct user control, and are optimized for on-wafer measurements.

In this webinar, we will:
  • Understand the motivations of performing load pull measurements.
  • Learn how passive impedance tuners work (coaxial fundamental and harmonic, waveguide…).
  • See a demonstration of state-of-the-art impedance tuner technology at 5G FR1 and FR2 frequencies.



  • Session 2: An Introduction to Vector Receiver Load Pull Measurements

    Speaker
    Dr. Jonas Urbonas, Maury Microwave

    Summary
    Vector receiver load pull, also referred to as real-time load pull, has become the preferred load pull methodology of the 2010s and 2020s. Vector receiver load pull replaces a traditional scalar power meter and spectrum analyzer with a vector receiver, such as a VNA. Instead of measuring powers and de-embedding to the DUT reference plane, this methodology uses low-loss couplers between the tuners and DUT to sample the a1, a2, b1 and b2 waves at the DUT reference plane to calculate delivered input power, output power, power gain and PAE. Advantages of this method include a general dynamic range improvement as well as empowering the measurement of AM/PM, large-signal input impedance, and the independent fundamental and harmonic powers and impedances.

    In this webinar, we will:
  • Understand the motivations of performing load pull measurements.
  • Learn how to configure a vector receiver load pull bench.
  • See a demonstration of vector receiver load pull using a Maury Microwave XT-series automated impedance tuner, Maury/AMCAD IVCAD measurement and modeling device characterization software suite, and Copper Mountain Technologies’ Cobalt-series VNA.



  • Session 3: From Transistor Measurements to MMIC Design - How to Reach First Pass Design Success Using IVCAD

    Speakers
    Silvia Hernandez and Nicolas Labrousse, AMCAD Engineering

    Summary
    Get a full overview from pulsed IV measurements up to circuit design and MMIC stability analysis. A Key point for good models is the quality of the measurements and the right methodology to extract different behaviors. Following that, the amplifier's design is not finished until the stability analysis is done and validated.

    In this webinar, we will:
  • Guide you through good practices for Pulsed IV and S parameters measurements for GaN transistor compact model extraction.
  • Use Load pull measurements for model validation under large-signal operating conditions.
  • Design a PA using the extracted compact model and analyze its stability using STAN tool.



  • Session 4: High-Power High-Gamma Hybrid-Active Waveguide Load Pull Measurements at 50-110 GHz

    Speaker
    Dr. Jonas Urbonas, Maury Microwave

    Summary
    During the initial stages of device technology development, timely feedback to device development engineers is important to accelerate the development process. Quickly and accurately benchmarking the performance of various semiconductor technologies using small periphery devices contributes to reducing development costs and expediting time to market. This can be achieved using hybrid-active vector receiver load-pull systems providing |ΓL| = 1 at the DUT reference plane at E- and W-Band frequencies. The measured vector a and b waves enable the characterization of various DUT parameters, such as delivered input power, output power, power gain and PAE that are not normally available from scalar measurements. This enables higher device characterization accuracy, facilitating more accurate device parameter extraction for better model fidelity.

    In this webinar, we will:
  • Understand the challenges of performing on-wafer load pull measurements at mmW frequencies.
  • Learn how to configure a hybrid-active waveguide vector receiver load pull bench.
  • See a demonstration of hybrid-active waveguide vector receiver load pull using a Maury Microwave waveguide automated impedance tuner, Maury/AMCAD IVCAD measurement and modeling device characterization software suite, and Keysight Technologies PNA-X VNA.



  • Session 5: Anticipate RF Power Amplifiers Performances with IQSTAR in base-station-like operation conditions

    Speaker
    Arnaud Delias, AMCAD Engineering

    Summary
    Linearity specs of Power Amplifiers using 5G wideband modulated signals is a "must-have" for RFPA designers. Although the characterization of the PA can be done using different Instruments available in the labs, the DPD evaluation on such RFPA is done using RFIC transceivers with an FPGA to mimic the base-station-like conditions as much as possible. Using IQSTAR, the designer can easily switch between benches and instruments to characterize the PA under multiple conditions.

    In this webinar, we will:
  • Demonstrate fast and accurate IFBW measurements on a PA.
  • Perform DPD performance evaluation on a PA using High-End instruments.
  • Evaluate DPD Performance using COTS RFIC Transceiver Demo-Board and FPGA in a base-station-like operation condition.



  • Session 6: mmW and Sub-THz 50Ω Gain Compression and Active Load Pull Measurements

    Speaker
    Dr. Jonas Urbonas, Maury Microwave

    Summary
    Performing device characterization measurements at millimeter-wave and sub-THz frequencies can be challenging for several reasons. First, it’s difficult to achieve accurate and repeatable power-control at the DUT reference plane when using waveguide extenders between 110 GHz and 1.1 THz, as the extenders typically output a fixed power. However, controlling the power delivered to the input of the DUT is critical in setting the device’s operating conditions and characterizing its performance over power, such as the large-signal characteristic gain compression. Second, load pull, which means changing the load impedance presented to the DUT to an arbitrary non-50Ω value, is difficult as passive load pull impedance tuners are typically unavailable above 110 GHz, and even then, are limited in their ability to present high mismatches at the DUT reference plane. Load pull measurements are necessary for transistor designers to properly characterize and model the high-speed behaviors of their devices. For circuit designers, load pull measurements are used to determine the ideal matching conditions and optimize performance, at powers where every fraction of a dB is important. Load pull can also be used to test systems, such as new mm-wave radars, where both contacted and over-the-air performance testing is needed. Vertigo Technologies has overcome these challenges with its MMW-STUDIO mmW and Sub-THz Characterization Software and Vector Modulator Unit (VMU).

    In this webinar, we will:
  • Understand the motivations of performing load pull measurements at mmW and sub-THz frequencies.
  • Learn how to configure a sub-THz active load pull bench.
  • See a demonstration of mmW and sub-THz active load pull using Vertigo Technologies vector modulator unit (VMU) and MMW-STUDIO mmW and Sub-THz Characterization Software, Rohde & Schwarz ZNA-series VNA, and MPI TS3000 probe station.



  • Session 7: Simulate Realistic Communication Systems Performance Using VISION

    Speaker
    Wissam Saabe, AMCAD Engineering

    Summary
    Learn more about cutting-edge RF circuit behavioral modeling methodologies to simulate actual performances of complex RF Systems. Accurate behavioral models are the key to successful system integration. Models that handle complex phenomena like frequency memory effects and mismatched conditions are a must-have to design advanced 5G communication systems and active antenna arrays

    In this webinar, we will:
  • Demonstrate RF circuit behavioral model extraction using simulated and measured data.
  • Simulate a large phased-array antenna system while considering RF front-ends behavior.
  • Run a virtual DPD bench on an RFPA design minimizing ACPR regrowth caused by memory effects.



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