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On-wafer GaN Power Semiconductor Characterization

October 16 2014

Maury Microwave presented its paper "On-wafer GaN Power Semiconductor Characterization" at Cascade Microtech's 2014 Users' Community (COMPASS) in Rome.

This presentation covered the motivation and challenges related to characterizing Gallium Nitride transistors on-wafer, including how to handle simultaneously high voltages and currents while at the same time providing undistorted narrow-pulse widths to eliminate self-heating effects. Proper equipment selection, best practices and calibration and GaN transistor measurements were presented.

More information regarding Power Semiconductor Parametric Analysis can be found here.

The COMPASS 2014 presentation regarding On-wafer GaN Power Semiconductor Characterization can be found here.



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IVCAD 3.9 Release - July 7 2021
IQSTAR 1.2 Release - June 22 2021
IQSTAR 1.1 Release - July 15 2020
COVID-19 Update - March 24 2020
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IVCAD 3.8 Release - December 13 2018
High-Resolution Current Probes - January 26 2018
PNA B-Series Support - December 12 2017
Diplexers and Triplexers - November 19 2015
Expanded Measurement Services - October 28 2015
Low-Loss Couplers - May 25 2015
IVCAD Videos - PIV and STAN - February 20 2015
IVCAD Magic Source Pull - July 1 2014
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IVCAD Video - June 5 2014
12 GHZ BNC cal kit - June 4 2014
LabVIEW Tuner Drivers - March 1 2014