Applications

High Speed Tuning Vector Receiver Load Pull Measurements Large Signal Analysis, Nonlinear VNA Measurements and Behavioral Model Extraction Linear and Nonlinear Compact Modeling Noise Figure / Noise Parameter Measurements Active Load Pull and Hybrid-Active Load Pull Measurements Active Wideband-Impedance Load Pull Measurements for 4G, 5G and WLAN Signals mmW and Sub-THz 50Ω Gain Compression and Active Load Pull Measurements Mobile Phone Testing Under Real-World Conditions Amplifier Stability and Ruggedness Testing On-Wafer Production Testing Stability Analysis of Microwave Circuits

Products

IVCAD Advanced Measurement and Modeling Software (MT930 series) ATS Automated Tuner Software (MT993 series) IQSTAR Circuit Measurement and Analysis Software (IQS series) MMW-STUDIO mmW and Sub-THz Characterization Software (MT920 series) AMTS Automated Mobile Test Software (MT910 series) Mixed-Signal Active Load Pull System (MT1000 and MT2000 series) MTUNE Tuner Characterization and Control Software Automated Tuners / Impedance Tuners / Load Pull Tuners Manual Tuners / Impedance Tuners Pulsed IV Systems (AM3200-series) Pulsed SMU Systems (AM3100-series) Noise Receiver Modules (MT7553 series) Transistor Test Fixtures (MT964 series) Low Loss Couplers (LLC series) Precision Low-Loss Multiplexers (DP/TP series) High-Power Low-Loss Pulsed Bias Tees (MBT series) High-Resolution Current Probes (AVCP series) Harmonic Phase References (HPR series)

Products

Insight Calibration & Measurement Software VNA Calibration Kits Verification Kits Coaxial Calibration Standards Waveguide Calibration Standards Metrology Torque Wrenches Connector Gage Kits Noise Calibration Systems and Accessories Stub Tuners

Services

VNA Cal Kit Verification and Calibration Torque Wrench Calibration Warranty & Service

Products

Adapters

Calibration-Grade (Metrology) Adapters

ColorConnect™ Precision Adapters

Test Essentials™ Lab Adapters

Quick Test Push-On Adapters

Cable Assemblies

StabilityVNA™ Test Port Cable Assemblies

StabilityPlus™ Cable Assemblies

StabilityPlus™ Low Profile Cable Assemblies

StabilityFlex™ Cable Assemblies

StabilityWafer™ Cable Assemblies

StabilityTVAC™ Cable Assemblies

Attenuators TW-series Torque Wrenches Connector Gage Kits

Services

System Integration Services Measurement Services System-Level Verification Devices and Device Characterization Services Rental, Lease, Finance Services VNA Cal Kit Calibration Torque Wrench Calibration Warranty Service

Resources

Application Notes Library Videos

Products and Solutions Overview

Software Overview

Best Practices and Tips-and-Tricks

Seminars and Webinars

Software Download Site

VNA Cal Kit Files

Maury Microwave News

What's Happening at Maury

News & Press Releases

Press Releases, New Product Releases, New Literature, Announcements

IMS 2013 Short Course: Demystifying Device Characterization

June 3 2013

One of only two short courses offered at IMS 2013, Demystifying Device Characterization concentrated on the Design Flow from component-level to circuit-level to system-level measurement and modeling.

The objective of the course was to introduce participants to advanced techniques such as compact model extraction from pulsed IV/RF measurements, load pull techniques for measurement and modeling validation, amplifier and IC design in ADS, stability analysis of ICs and finally X-Parameter and system-level modeling.

More information regarding Maury's participation in IMS 2013 SC-2 can be found here.

Past News

Maury Microwave to Acquire Wireless Telecom Group - May 25 2023

Brand-new web store launch - May 18 2023

IQSTAR1.5 Release - April 27 2023

everythingRF.com interview with Michael Howo - March 6 2023

Microwave Journal Article - January 31 2023

ISO/IEC 17025:2017 accreditation - January 9 2023

New StabilityWafer™ On-Wafer Probing Cable Assemblies - December 20 2022

MTUNE3 Release - December 12 2022

IQSTAR 1.4 Release - November 17 2022

IVCAD 3.10 Release - April 14 2022

New High Power and High Frequency Instrument Amplifiers to 67 GHz - March 31 2022

New StabilityFlex™ Ultra-Flexible Cable Assemblies - March 30 2022

New StabilityPlus™ and StabilityVNA™ Product Line Expansion - March 4 2022

IQSTAR 1.3 Release - February 24 2022

New 67 GHz MT2000 Active Load Pull System - February 11 2022

Maury Microwave Announces Acquisition of dBmCorp - October 5 2021

New StabilityTVAC™ Thermal Vacuum Cable Assemblies - August 9 2021

IVCAD 3.9 Release - July 7 2021

Maury Acquired by Artemis - New Era of Strategic Partnership, Innovation, & Growth at Leader in RF Calibration, Measurement and Modeling - June 24 2021

Nano5G Automated Impedance Tuner - June 18 2021

On-Wafer Large-Signal Transistor Characterization from 70–110 GHz - February 15 2021

The Maury Immersive Experience - January 8 2021

The Industry's Best VNA Test Port Cable Assembly - August 7 2020

67 GHz Low-Loss High-Power Couplers - April 14 2020

Maury Receives Raytheon Integrated Defense Systems Supplier Excellence Award - March 30 2020

COVID-19 Update - March 24 2020

Frequency Scalable Power Control and Active Tuning for Sub-THz Large Signal Measurements - February 14 2020

18 GHz 75ohm Type N cal kit - February 13 2020

Application Note on Characterizing Uncertainty in S-Parameter Measurements - October 16 2019

New Characterized Device (CD) Calibration Kits and Verification Kits - June 10 2019

Insight VNA Calibration and Measurement Software - May 30 2019

Vertigo Technologies Empowers Millimeter-Wave and Sub-Terahertz Active Load Pull - May 29 2019

AM3100 Pulsed SMU System - May 16 2019

MT2000 Modulation Bandwidth Extended to 1000 MHz for 5G Applications - April 1 2019

New High-Frequency High-Power Instrument Amplifiers - February 18 2019

High-Power Low-Loss Pulsed Bias Tees - October 22 2018

MT2000 Modulation Bandwidth Extended to 500 MHz for 5G Applications - August 22 2018

Overcoming the Challenges of On-Wafer Load Pull Measurements at mmW Frequencies for 5G - July 13 2018

The industry's BEST phase-stable cable assemblies just got better! - June 18 2018

XT-Series Tuners: Faster, More Accurate, More Repeatable - June 8 2018

New Noise Receiver Modules Enable Highly Accurate Wideband Noise Parameters to 65 GHz - June 6 2018

65 GHz Color-Coded Attenuators - April 27 2018

Test & Measurement Instrument Amplifiers - March 30 2018

High-Resolution Current Probes - January 26 2018

LXI™-Certified Millimeter Wave Automated Tuners - January 22 2018

AS9100D and ISO 9001:2015 Certification - January 9 2018

PNA B-Series Support - December 12 2017

High-Power Low-Loss Pulsed Bias Tees - June 2 2017

A Robust, Large-Signal Model for LDMOS RF Power Transistors - January 27 2017

3rd Generation Pulsed IV System Launched - December 1 2016

Application Note on Integrated, Turnkey Modeling & Measurement Systems - March 29 2016

Diplexers and Triplexers - November 19 2015

Low-Frequency MT1000 and MT2000 Solutions Cover 1 MHz to 2 GHz - November 17 2015

Application Note on Behavioral Model Extraction Using EPHD Methodology - November 9 2015

Expanded Measurement Services - October 28 2015

Application Note on Comparing NVNA Methodologies - August 21 2015

Low-Loss Couplers - May 25 2015

Application Note on Harmonic Impedance Matching - April 15 2015

Maury Microwave Acquires Anteverta-mw - March 31 2015

AMTS supports Keysight E7515A UXM for LTE measurements - February 24 2015

Microwave Journal Interviews Marc Maury - February 17 2015

microwaves&rf Features Gary Simpson as CTE - December 1 2014

On-wafer GaN Power Semiconductor Characterization - October 16 2014

IEEE Region 6 Award for 2014 Corporate Support - July 14 2014

IVCAD Magic Source Pull - July 1 2014

High Speed Tuning - June 6 2014

MT1000 Product Launch - June 6 2014

12 GHZ BNC cal kit - June 4 2014

MT2000 Used For Advanced Industry Design - April 7 2014

LabVIEW Tuner Drivers - March 1 2014

Power Semiconductor Pulsed IV to 1000V for GaN, SiC - June 28 2013

Microwaves&RF Interviews Greg Maury - June 14 2013

Best Customer/Technical Service Award - June 7 2013

IMS 2013 Short Course: Demystifying Device Characterization - June 3 2013

Connect With Confidence: Color-Coded Interconnects - April 17 2013

Microwave Journal Interviews Mauro Marchetti - January 15 2013

New Test Essentials™ Precision and Lab Adapters - June 1 2012

On-Wafer Production Testing in Seconds! - May 31 2012

IVCAD Stability Analysis Tool - April 21 2012

New Application Note on Compact Transistor Models - March 28 2012

Active Load Pull Surpasses 500W! - November 8 2011

Maury Microwave is Keysight Technologies Global Solutions Partner

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