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IMS 2013 Short Course: Demystifying Device Characterization
June 3 2013
One of only two short courses offered at IMS 2013, Demystifying Device Characterization concentrated on the Design Flow from component-level to circuit-level to system-level measurement and modeling.
The objective of the course was to introduce participants to advanced techniques such as compact model extraction from pulsed IV/RF measurements, load pull techniques for measurement and modeling validation, amplifier and IC design in ADS, stability analysis of ICs and finally X-Parameter and system-level modeling.
More information regarding Maury's participation in IMS 2013 SC-2 can be found here.