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Application Note on Characterizing Uncertainty in S-Parameter Measurements

October 16 2019

Maury Microwave has released its latest application note regarding characterizing uncertainty in S-parameter measurements, featured in the October 2019 edition of the Microwave Journal.

Article "Characterizing Uncertainty in S-Parameter Measurements" introduces the concepts of uncertainty and the benefits of uncertainties as they relate to S-parameter measurements. Uncertainty can aid in definitively verifying a VNA calibration before measuring a DUT. Uncertainty can help understanding how the various components in a measurement system impact the overall uncertainty of the DUT measurement. Identifying, quantifying and reducing the major sources of uncertainty in a test setup will improve the accuracy of the overall measurement.

Maury Microwave Application Note 5A-071 “Characterizing Uncertainty in S-Parameter Measurements” is available for download here.

The original Microwave Journal article can be seen here.



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