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Application Note on Integrated, Turnkey Modeling & Measurement Systems

March 29 2016

Maury Microwave has released its latest application note regarding its measurement-to-model design flow, featured in the March 2016 edition of the Microwave Journal.

Article "Integrated, Turnkey Modeling & Measurement Systems" introduces the design flow from synchronized pulsed IV/S-parameters and linear/nonlinear compact transistor model extraction to load pull for model validation and circuit design, to behavioral model extraction and stability analysis of integrated circuits.

Maury Microwave Application Note 5A-068 “Integrated, Turnkey Modeling & Measurement Systems” is available for download here.



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