IMS 2013 Short Course: Demystifying Device Characterization
June 2, Seattle, WA, Room 613-614
Short Course Summary
One of only two short courses offered at IMS 2013, Demystifying Device Characterization concentrated on the Design Flow from component-level to circuit-level to system-level measurement and modeling.
The objective of the course was to introduce participants to advanced techniques such as compact model extraction from pulsed IV/RF measurements, load pull techniques for measurement and modeling validation, amplifier and IC design in ADS, stability analysis of ICs and finally X-Parameter and system-level modeling.
Instructors included specialists from Maury Microwave (Steve Dudkiewicz and Gary Simpson), Agilent Technologies (Andy Howard and David Ballo) and AMCAD Engineering (Tony Gasseling and Stephane Dellier).
Maury would like to extend a special Thank You to all instructors and participants.