Maury Application Notes Library
Download application notes relating to Maury products and Subjects of Interest
To download a copy of Maury Microwaves Application Notes on a particular subject, click on the title(s) of your choice from the list below. These files will download to your computer as .pdf (portable document format) files and can be viewed with Adobe® Acrobat Reader™.
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Recent Additions To Our Application Notes Library
Verifying the Performance of Vector Network Analyzers
Author: Mario A. Maury, Jr. - Maury Microwave Corp. First published in July 1989; Revised and republished: July 1999 and February 2006. A discussion of procedures that can be used to verify the performnace and operation of a Vector Network Analyzer (VNA) using just the equipment available in a standard Maury precision calibration kit.
Verifying VNA Source Match Using Coaxial Offset Shorts
Author: Bill Pastori - Maury Microwave Corp. First published in March 1990; Revised and republished in february 2006. The purpose of this application note is to describe a method, using just a long offset short, of evaluating effective source match in coaxial measurement systems.
Comparison of Harmonic Tuning Methods for Load Pull Systems
Author: Gary Simpson, MSEE; Director of Technical Development in Engineering - Maury Microwave Corp. February 2004. A discussion of three methods of harmonic tuning that have been offered commercially for load pull systems with passive automated tuners. The relative advantages and disadvantages of each are examined and compared.
Introduction to Tuner-Based Measurement and Characterization
Author: John Sevic, MSEE; Automated Tuner System Technical manager - Maury Microwave Corp. February 2004.
A discussion of tuner-based RF device characterization and measurement. A rational for automated tuner-based measurement and automated tuner-based device characterization is given, followed by a discussion of the factors that drive the choice of tuner architecture. These factors include repeatability, impedance range, tuner speed, power capability, tuner resolution, bandwidth, and the size, level of integration, and ease of integration that are characteristics of various automated tuners. Detailed explanations of how tuners synthesize impedance, when and how tuner resolution is important, and why tuner repeatability is critical, are also given. System configuration examples are given and discussion of advanced capabilities of automated tuner-based measurements is included. A glossary of terms related to these subjects is provided.
Basic Verification of Power Loadpull Systems
Author: John Sevic, MSEE; Automated Tuner System Technical manager - Maury Microwave Corp. October 2004.
A discussion of loadpull system verification using Maury ATS tuners, including a rigorous method of verifying loadpull calibration for power applications. Two examples of Delta_Gt verification are presented and compared. Also covered are common sources of error in Loadpull, and quantifying and controlling error in loadpull.
Specifying Source-Tuner Terminating Impedance With Maury ATS
Author: John Sevic, MSEE; Automated Tuner System Technical manager - Maury Microwave Corp. November 2004.
The source impedance presented at the DUT reference-plane by the source-tuner is a function of the source-tuner and its terminating impedance. The terminating impedance is based on the interaction of several signal conditioning elements, such as a bias tee, a coupler, a low-pass filter, and a reference PA. How the effect of this impedance is compensated for within ATS may have a deleterious effect on the accuracy of the source impedance displayed at the DUT reference-plane. This application note describes the various methods in which Maury ATS will compensate for this impedance.
Automated Tuner System (ATS) Related Subject
Noise Characterization Using the Maury Automated Tuner System
The purpose of this note is to provide the user of a Maury Automated Tuner System (ATS) with some insight into achieving precise, consistent results in a noise characterization measurement. (Dec 14 1999).
Verifying the Performance of Vector Network Analyzers
Describes the procedures that can be used to verify the performance and operation of a vector network analyzer (VNA) using just the equipment available in a standard Maury precision calibration kit.
Data-based Load Pull Simulations for Large-Signal Transistor Model Validation
A new discussed method for large-signal transistor model verification. Permission reprint by Microwave Journal; Vol. 40, No.3 - March 1997.
Verifying the Performance of Vector Network Analyzers
Describes the procedures that can be used to verify the performance and operation of a vector network analyzer (VNA) using just the equipment available in a standard Maury precision calibration kit.
Measurement of Large-Signal Device Input Impedance during Load Pull
Describes a technique for directly measuring large-signal device input impedance on a load or source pull test while using a vector network analyzer.
Device Characterization Using the Automated Tuner System (ATS)
This brief survey discusses the art of device characterization looking at where we have been and what is available to device engineers today, as well as a view toward what devices we can develop for tomorrow.
Tuner Repeatability: Fact and Fiction
Defines repeatability and discusses the repeatability specifications role in, determining how accurately and reliably a given tuner will perform. Knowledge of a tuner worst-case total repeatability specifications for all positions (and over its full frequency range ) is vital in determining how that tuner will perform.
MT2075 Control of a User-defined LO for Microwave Noise Figure Measurement
A step-by-step for entering a user-defined LO via GPIB command.
A Calibration Procedure for On-Wafer Differential Load-Pull Measurements
This paper presents a calibration technique for on-wafer differential load-pull measurements. The described calibration procedure makes use of a standard GS/SG calibration substrate only. The calibration accuracy achieved is verified through various independent standard measurements.
Fixture Characterization and S-Parameter Measurement Using Maury MT956D Software
Explains how to expand and simplify VNA generated s-parameter measurements using an inexpensive personal computer and Maury's MT956D software package.
Theory of Load and Source Pull Measurement
A brief discussion of the basics of load and source pull measurements.
Theory of Noise Measurement
A brief discussion of the basics of noise measurements.
Theory of Intermodulation Distortion Measurement
A brief discussion of the basics of Intermodulation distortion measurements.
Device Characterization with Harmonic Source and Load Pull
Describes how matching the requirements and capabilities of network devices can increase the efficiency and linearity.
RF Device Characterization Techniques and Methods
Pre-Matching Network Based on a Two-Tier TRL calibration
Appearing in the Microwave Journal, March 1999 by John F. Sevic, describes how a sub 1 ohm load pull quarter-wave prematching network can be based on a two-tier TRL calibration.
Device Characterization with Harmonic Source and Load Pull
Describes how matching the requirements and capabilities of network devices can increase the efficiency and linearity.
Importance of 2nd Harmonic Tuning for PA Design
Presented in the 48th ARFTG Conference in Clearwater, Florida on December 5-6, 1996 by Gary R. Simpson and Mark Vassar. This kit is designed for three types of calibration methods rather than just one.
Automated Large-Signal Load-Pull Characterization of Adjacent-Channel Power Ration for Digital Wireless Communication Systems
Authors: John Sevic, MSEE, Robert Baeten, Gary R. Simpson and Michael B. Steer. September 2000. Reprinted with revisions from the 46th ARFTG Conference Digest Fall 1995.
Large-signal adjacent-channel power ratio load-pull contours of a GaAs MESFET and a GaAs MEMT excited by π/4-DQPSK modulation are demonstrated for the first time using an automated load-pull system. It is shown that in general there is only a weak releationship between two-tone third-order intermodulation and adjacent-channel power ratio for the (Japanese) Personal Digital Cellular standard.
Maury Microwave Miscellaneous and Accessories
Software Upgrade from Revision 2.20 to 3.00Other Subjects of Interest
A change notice of software upgrade from revision 2.20 to 3.00. This notice explains major features for the revision 3.00, as well as the limitations offered for this version. Revision 2.20 explains driver changes required for user written drivers.
Improving SMA Tests with APC 3.5 Hardware
Some experts compare SMA connectors in the laboratory to fish out of water. But APC 3.5 calibration devices, and a little specialized software, can net the needed improvements. Article reprint from Microwave Journal; Vol. 20, No.9 - September 1981.
Improved Millimeter Waveguide Flanges/ Improved Components and Measurements
Discusses how new flange designs that mate with existing flanges offer superior performance in the Millimeter-wave bands from 18 to 110 GHz. Includes measurement techniques fro evaluating accuracy and results obtained by using the new flange designs. Article reprint from Microwave Journal; Vol. 29, No.5 - May 1987.
LRL Calibration of Vector Network Analyzers
Compares certain vector network analyzer calibration methods: OSL (open-short-load), TSD (thru-short-delay), TRL (thru-reflect-line). Article reprint from Microwave Journal; Vol. 30, No.5 - May 1987.
Programmable Tuner Commands Impedance 4.0 - 26.5 GHz
Highlights certain features of the Maury MT983A automated tuner and some of its applications (from device characterization
to antenna calibration. Article reprint from Microwave & RF; Vol. 28, No.6 - June 1989.
ATS for Power/Noise Characterization Using PC-AT Based Software
Describes how the use of broadband precision automated tuner systems, driven by PC-AT based software, can improve efficiency and provide more cost-effective solutions for device characterization applications. Article reprint from Microwave Journal; Vol. 36, No.5 - January 1993. (Not available fro download at this time).
Microwave Coaxial Connector Technology: A Continuing Evolution
An overview of basic coaxial connector technology, with discussion of connector types, IEEE standards, predominance of 50 ohm impedance, and the historic development of popular connector types. Article reprint from Microwave Journal 1990 State of the Art Reference.
Firmware Improves 10-200 MHz Noise Figure Meter
Announces Maury Microwaves acquisition of the Eaton 2075B noise figure meter and describes subsequent improvements. Article reprint from Microwave & RF; Vol. 31, No.1 - January 1992. (Not available fro download at this time).
ATS for Power/Noise Characterization Using PC-AT Based Software
Describes how the use of broadband precision automated tuner systems, driven by PC-AT based software, can improve efficiency and provide more cost-effective solutions for device characterization applications. Article reprint from Microwave Journal; Vol. 36, No.5 - January 1993. (Not available fro download at this time).
Automated Tuner System aids IMD Testing
Describes how the use of an automated tuner system with appropriate software simplifies intermodulation distortion (IMD) measurement. Article reprint from Microwave & RF; Vol. 33, No.1 - January 1994.
Add range to Noise Gain Analyzers
Describes how Maury Microwaves MT7550 series of frequency extenders can increase the capabilities of the noise gain analyzers. Article reprint from Microwave & RF; Vol. 33, No.10 - October 1994.
A Simplified Approach to Noise Figure Measurements
The application and performance of the noise figure measurement system that includes frequency converter - referred to as the noise frequency extender (NFE) is described. Article reprint from Microwave Engineering Europe - October 1994.
Will the Real TNC Connector Please Stand Up?
A survey of ten variations in the TNC connector interfaces that have come into industry-wide use for over the past 20 years; incompatibility issues these have created; and consequent performance problems that may arise from mixed ages. Article reprint from Microwave Journal - May 1999.
A New 3.5mm TRL/LRL Calibration Kit
A discussion of Maury series 8060A 3.5mm TRL/LRL calibration kits, with a detailed comparison of three VNA calibration methods; TRM, TRL and LRL.
A Precision TNC Connector Gage Kit
A discussion of Maury model A012E connector gage kit, universal set of tools designed to measure the contact pin and dielectric locations of all commonly used TNC connectors. Article reprint from Microwave Journal - April 1999
Noise Characterization using the Maury Automated Tuner System (ATS)
Provides insight into achieving precision, consistent results in noise characterization. Discusses some of the more subtle problems (and their solutions) occurring in noise characterization applications. Not available for download at this time
Verifying VNA Source Match Using Coaxial Offset Shorts
Author: Bill Pastori - Maury Microwave Corp. First published in March 1990; Revised and republished in february 2006. The purpose of this application note is to describe a method, using just a long offset short, of evaluating effective source match in coaxial measurement systems.
Applications of Maury Noise Calibrations
Details the use of Maury noise calibration systems as highly accurate and reliable sources of RF and microwave noise, and as calibration standards for other noise generators. (Not available for download at this time).
MT2075 Control of a User Defined LO for Microwave NF Measurements
Details that use Maury model MT2075 noise gain analyzer permits the user to introduce any desired local oscillator (LO) into noise figure measurement application.
Handy Microwave Equations
A convenient reference sheet of equations commonly used in various microwave engineering applications. Equations shown here include Return Loss, Source Match, Peak-to-Peak Ripple in dB, Outer Conductor Diameter, Mismatch Loss, and others.
VSWR vs. Return Loss
A two-page table that shows return loss associated with various VSWR values.
Frequency-to-Wavelength Conversion Nomograph
A convenient reference for converting frequency to wavelength in nomograph format.
Source Match (dB) vs. Peak-to-Peak Ripple
A graph tabular data correlating source match (dB) with peak-to-peak ripple (dB). A handy reference for determining the reliability of VNA calibrations.