Features

• Extremely Fast
• Fully integrated Turnkey System
• Small Size is Ideal for On Wafer
• Solid State Accuracy
• Fully Characterizes Noise Parameters
• Measures Parameters versus DC Bias
• Performs Fixture or Probe De-embedding

Description

Maury's NP Noise Parameter and S-Parameter Test System is a solid state tuner-based, fully integrated, turnkey solution for complete small signal device characterization. When used in conjunction with a network analyzer and noise figure analyzer, it offers an ideal means of measuring noise parameters and S-parameters,with full device characterization versus bias.

Three basic configurations of the Noise Parameter System are offered:

NP System for RF Measurement (300 MHz - 6 GHz)

NP System for MW Measurement (2 GHz - 26.5 GHz)

The Solid State Advantage

Solid State tuner technology provides the most accurate measurement at lightning-fast speed. This helps the designer measure with confidence in minimum time; saving money and reducing the number of iterations between initial concept and verified design -- an ideal combination for successful time to market.

Some of the more unique contributions that solid state technology brings to the RF device measurement environment are the capability to make measurements with a single connection to the device under test (DUT); in-situ calibration which adds to overall measurement accuracy; and PC-based software that is easy to use and even easier to set up and configure for various measurement modes and methods.

As the need to make on-wafer measurements has increased, the need to have an ideal on-wafer configuration has been increasingly recognized. The ideal configuration would include the closest possible proximity of the tuner to the DUT (to minimize loss, and thereby increase accuracy) and would be free of any vibration or shock from mechanical movement. Maury's solid state tuners, with their small size and design, are a perfect solution for on-wafer applications.

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