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System Control Application Software
(MT993F Option)

The Maury Windows® 98/2000/XP compatible System Control Application Software (MT993F option) saves you time and money by permitting a complete device test with only a single connection. This option adds automated switching to Maury's MT993A/B/C applicatin software, so that one RF setup can be programmed to automatically switch between any of the following measurement functions:
S-parameter
noise
power IMD/ACP

The same RF setup can also be programmed to automatically switch between any of the following signal sources:
VNA sourcer
local oscillator for the noise downconverter
power characterization source

The ability to switch signal sources permits equipment sharing, which reduces overall equipment and operating costs by as much as the cost of two RF sources!

This option allows for - but does not require - an on-line vector network analyzer (VNA). If an on-line VNA is available, it can be calibrated at the device-under-test (DUT) plane (or at the fixture plane and de-embedded). Then, without breaking the setup, both input and output tuners can be characterized, the noise source and power sensor reflection co-efficients can be measured, and the system can be calibrated for noise and power - all with no operator intervention. Time-consuming measurement operations can run completely unattended.

Figure 7-1 (at right) shows a typical SNP setup, which can be expanded to add intermod or ACP.

Complete system integration can be achieved with the MT993F system control option and the addition of one of the MT998 series of system control units. (See Maury Data Sheet 4T-062A for details.)

Block Diagram Interface (Figure 7-1)

Complete system configuration (including test equipment, equipment drivers, measurement parameters, and test conditions) can be performed from this GRAPHICAL INTERFACE display. It is an interactive display, from which users can configure, save, recall, and control various test setups for different applications. These block diagrams can be edited at any time. Each icon in the block diagram represents actual instruments in the test setup, and each is configurable to match the characteristics of those instruments. Each instrument represented in the block diagram can be independently turned on or off as desired, to simulate various operating conditions.