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Intermodulation Distortion and Adjacent Channel Power Application Software
(MT993D Option)

The Maury Windows® 98/2000/XP compatible MT993D IMD/ACP application software is designed to operate with the Maury Automated Tuner System (ATS) in conjunction with the power characterization software (MT993A/C). All functions and operating modes available with the power characterization software are retained with the addition of the IMD/ACP mode.

IMD/ACP Parameters

When two signals are simultaneously present, device non-linearity can cause frequency mixing. Odd order mixing (e.g., the fundamental of one signal mixing with the second harmonic of the other) results in a pair of mixing products which straddle the original pair and are displaced by the separation between the two tones. The magnitude of these products is a measure of the device non-linearity. Adjacent channel power usually refers to the "spill-over" of a signal (typically, digitally modulated) into the adjacent or next adjacent communications channel. Knowledge of the magnitude of these products and other related parameters, as well as the termination conditions for minimizing or maximizing them, can be a significant help to the amplifier and system designer.

An ATS, operating with the Maury power and IMD/ACP application software, can provide fast, accurate measurements of power parameters and can perform other functions, such as 3rd through 7th order IMD power, carrier power, C/I ratio, intercept point, and first and second upper and lower adjacent channel power.

The block diagram interface screen (figure 4-1, at right) illustrates a typical measurement setup as displayed by the Windows® 98/2000/XP compatible GRAPHICAL INTERFACE SCREEN.

Block Diagram Interface (Figure 4-1)

Complete system configuration (including test equipment, equipment drivers, measurement parameters, and test conditions) can be performed from this GRAPHICAL INTERFACE display. It is an interactive display, from which users can configure, save, recall, and control various test setups for different applications. These block diagrams can be edited at any time. Each icon in the block diagram represents actual instruments in the test setup, and each is configurable to match the characteristics of those instruments. Each instrument represented in the block diagram can be independently turned on or off as desired, to simulate various operating conditions.