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Large-Signal
Network Analysis Technology
Download
application notes and other literature relating to the
Maury/NMDG MT4463A
Large-Signal Network Analyzer (LSNA), and its methodology.
The literature listed below addresses many aspects of large-signal network analysis, with an emphasis on LSNA theory and methodology. Many of these papers were originally posted on the Agilent Technologies web site (agilent.com/find/lsna) and are republished here, as they were found, with permission from Agilent.
To download copies of our LSNA Key Literature, click on the title(s) of your choice from the list below. These files will download to your computer as .pdf (portable document format) files and can be viewed with Adobe® Acrobat Reader™.
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Most Recent Literature
Advanced Component Characterization Beyond S-Parameters; From Small- to Large-Signal, All In One
Marc Vanden Bossche, 2007 ..... Powerpoint Presentation .... 66 pages .....  3.7 MB
This slide set introduces large-signal network analysis technology as it applies to analog or digital high-frequency components. Topics discussed are: Why "Large-Signal Network Analysis" is needed; The Vector Network Analyzer; The Large-Signal Network Analyzer; Calibration; Revceiver Front-Ends and Commercial Products; LSNA Software and Capabilities; Non-50 Ohm Measurements; Examples of Applications; and Conclusions.
Data Sheet; NM100 VNA+; Large-signal Network Analysis with agilent N5230A, Possibly in a Non-50 Ohm Environment
Marck Vanden Bossche, 2006 .... 15 pages ..... 2.4 MB
This NMDG Data Sheet discribes the model NM100 VNA+ Large-Signal Network Analysis Extension Kit developed and manufactured by NMDG Engineering and licensed and sold by Maury Microwave. A detailed explaination of how the NM100 VNA+ combines Large-Signal Network Analysis with advanced functions of the Agilent N5230A is provided, along with discussion of the basic system concept, followed by a brief list of LSNA hardware included in the system. A block diagram with discussion of applications and benefits is included, along with overall performance specifications, software options, GUI, scripting language, DLL connectivity and other advanced user features.
Product Note: NM100; Extension Kit for VNA Characterization of Nonlinear RF/HF Components in Time and Frequency Domain
Marc Vanden Bossche, 2006 ..... 5 pages .....
1.6 MB
This product note discusses the NM100 Extension Kit and its use, in combination with the Agilent N5230A to perform VNA characterization of nonlinear RF/HF components in time and frequency domain. The note addresses the fact that certain "nonlinear" features currently being introduced into some VNA models by their manufacturers only provide partial measurement data. The NM100, combined with the Agilent N5230A provides complete harmonic characterization of high-frequency components under realistic conditions.
Product Note: NM101; Extension Kit for VNA Characterization of Nonlinear RF/HF Components in Time and Frequency Domain
Marc Vanden Bossche, 2006 ..... 6 pages ..... 832 KB
This product note discusses the NM101 Extension Kit and its use, in combination with the Agilent E836X to perform VNA characterization of nonlinear RF/HF components in time and frequency domain. The note addresses the fact that certain "nonlinear" features currently being introduced into some VNA models by their manufacturers only provide partial measurement data. The NM101, combined with the Agilent E836X provides complete harmonic characterization of high-frequency components under realistic conditions.
Earlier Literature
(Except
as noted all literature listed below is Copyright ©
1998, 2000 Agilent Technologies, Inc. Republished with
permission courtesy of Agilent Technologies,
inc.)
Large-Signal Network Analyzer, Bringing Reality To Waveform Engineering ..... © 2003 Maury Microwave Corp.....
500 KB
Maury Microwave's Technical Data Sheet 4T-090 rev A (June, 2003) which discribes the model MT4463A Large-Signal Network Analyzer developed and manufactured by NMDG Engineering and Maury Microwave. An explaination of LSNA theory and methodology with discussion of the Maury/NMDG system concept is followed by a brief list of LSNA hardware included in the system. Integreated and turnkey (bundled) solutions are also mentioned along with a list of applications and benefits.
Large-Signal Network Analyzer, Preliminary Product Overview ..... © 2003 Maury Microwave Corp..... 255 KB
Maury Microwave's Application Note 5C-052 (June, 2003) which gives an in-depth discription the Maury/NMDG model MT4463A Large-Signal Network Analyzer with a detailed explaination of LSNA theory and methodology, the Maury/NMDG system concept, software and application examples.
Network
Analysis Beyond S-Parameters: Characterizing and Modeling
Component Behaviour Under Modulated Large-Signal
Operating
Conditions
.....
Dec
2000 .....
116
KB
This paper, from 56th ARFTG Conference Proceedings, shows
how the classical concepts of network analysis can be
extended towards modulated and large-signal operating
conditions.
Large-Signal
Network Analysis Technology to Help the R&D
Customer
.....
Sept
2002 .....
1,973
KB
This presentation introduces the R&D engineer to
large-signal network analysis and the analyzer technology
to characterize RF, microwave and high-speed digital
components and systems under periodic large-signals.
After explaining the theory, instrument block diagram and
calibration technique, practical examples are shown where
this technology brings new types of complete information
into the design process. This presentation is a very good
introduction to any of the more detailed
papers.
Large-Signal
Network Analysis - a measurement concept to characterize
nonlinear devices and
systems
.....
June
2002 .....
320
KB
This white paper is complementary to the presentation
"Large-Signal Network Analysis Technology to help the
R&D Customer". It provides in more detail insight in
large-signal network analysis and the analyzer
technology. The paper compares this with more tradional
approaches. Finally the paper gives an overview of the
types of measurements performed by the LSNA.
Removal
of Cable and Connector Dispersions (& Jitter) in
Time-Domain Waveform Measurements on 40Gb Integrated
Circuits
.....
June
2002 .....
1,313 KB
This presentation (presented at MTT-S 2002) demonstrates
the applicability of the LSNA to characterize the
performance of 40 Gbit data amplifiers in time domain
more accurately by removing cable effects and connector
dispersion using vector network analyzer
techniques.
Going
Beyond S-Parameters - Large-Signal Network Analysis for
High Frequency
Components
.....
Sept
2001 .....
864 KB
This paper was presented at the European Microwave
Conference on September 25, 2001. It is a thorough,
in-depth, and comprehensive briefing which sets forth, in
great clarity, the major issues surrounding large-signal
network analysis. It covers instrument hardware,
calibration aspects, and application examples.
ISCAS2001
Tutorial/Short Course & Special Session on High Speed
Devices &
Modeling
.....
May
2001 .....
2,601
KB
As one of several speackers in this full-day tutorial,
David E. Root (Agilent Technologies) presented this two
part short course to introduce large-signal modeling,
nonlinear charge/capacitance modeling, and black-box
behavioral modeling at the special session on High Speed
Devices and Modeling at IEEE's 2001 International
Symposium on Circuits and Systems. High Speed Devices and
Modeling.
Measuring
Transistor Dynamic Loadlines and Breakdown Currents Under
Large-Signal High-Frequency Operating
Conditions
.....
June
1998 .....
191
KB
The "Nonlinear Network Measurement System" accurately
measures dynamic loadlines and breakdown currents of
microwave transistors under high-frequency large-signal
operating conditions, allowing the designer to find
optimal operating conditions for a given device without
the need for large-signal models.
Characterizing
Components Under Large Signal Excitation: Defining
Sensible Large Signal
S-parameters
.....June
1997 .....
125 KB
A measurement and black-box modeling technique is
described enabling the characterization of nonlinear
microwave components under periodic large-signal
excitation in a mismatched environment.
Accurately
Characterizing Hard Nonlinear Behavior of Microwave
Components with the Nonlinear Network Measurement System:
Introducing "Nonlinear Scattering
Functions"
.....
Oct
1998 .....
2,601
KB
Presented to the 5th International Workshop on Integrated
Nonlinear Microwave and Millimeterwave Circuits, Duisburg
(Germany), this paper describes an original way of
dealing with the measuring and modeling of microwave
transistor nonlinear behavior. Although generalizations
are possible, the method described in this paper deals
with transistor behavior under a large-signal one-tone
excitation, with arbitrary impedance terminations for the
fundamental and the harmonics.
Easy
and Accurate Empirical Transistor Model Parameter
Estimation from Vectorial Large-Signal
Measurements
.....
June
1999 .....
96
KB
Presented to the 4th International Workshop on Integrated
Nonlinear Microwave and Millimeterwave Circuits
(INMMC'96), Duisburg (Germany), this paper proposes a
black box model for power transistors that can accurately
predict the behavior of the transistor for a one-tone
excitation with arbitrary fundamental and harmonic
impedances present at the output. The model parameters
can be extracted out of a limited set of "nonlinear
network analyzer" measurements. Both simulated as well as
measured results are given.
The
Three Musketeers of Large-Signal RF and Microwave Design
- Measurement, Modeling and
CAE
.....
June
1999 .....
178
KB
Presented to the 53rd ARFTG Conference in Anaheim,
California (USA), this paper explains and illustrates
that the voltage-current behavior of nonlinear devices,
components and systems is the basis for a framework for
the large-signal RF and microwave design and
manufacturing process. Thsi framework spans measurement,
modeling and CAE technology in a coherent way.
Black
Box Modeling of Power Transistors in the Frequency
Domain
.....
Oct
1996 .....
96
KB
Presented to the 4th International Workshop on Integrated
Nonlinear Microwave and Millimeterwave Circuits
(INMMC'96), Duisburg (Germany), this paper proposes a
black box model for power transistors that can accurately
predict the behavior of the transistor for a one-tone
excitation with arbitrary fundamental and harmonic
impedances present at the output. The model parameters
can be extracted out of a limited set of "nonlinear
network analyzer" measurements. Both simulated as well as
measured results are given.
Black
Box Modeling of Hard Nonlinear Behavior in the Frequency
Domain
.....
June
1996 .....
71
KB
Presented to the IEEE MTT-S 1996 in San Fransico,
California (USA), this paper proposes a black box model
to describe nonlinear devices in frequency domain. The
approach is based upon the use of describing functions
and allows a better description of hard nonlinearities
than an approach based upon the Volterra theory.
Simulations and experiments are described illustrating
the mathematical theory.
Telecommunications
and Nonlinear Device Behavior: Is it a Curse or is There
a Cure?
.....
1994
.....
44
KB
Nouvelles de la Science et des Technologies, Vol. 12, No.
3-4, pp. 175-177 (ISSN 0771-7369). This paper explains a
prototype of a measurement system for nonlinear RF and
microwave devices which measures both calibrated
amplitudes and phases of signals on an arbitrary
frequency grid and introduces black box modeling
capabilities starting from these calibrated
measurements.
Calibrated
Vectorial "Nonlinear Network"
Analyzers
.....
May
1994 .....
140
KB
Presented to the IEEE MTT-S 1994 in San Diego, California
(USA), this paper introduces the vectorial
nonlinear-network analyzer concept. A vectorial
nonlinear-network analyzer excites a nonlinear microwave
device-under-test with a combination of sinewaves of
different frequencies and accurately detects the pase and
mplitude of all frequency components of the incident and
the scattered waves. A new, statistic efficient, absolute
calibration procedure is devloped based on a low crest
factor multisine reference generator characterized by a
broadband sampling oscilloscope. This makes the
calibration traceable to the accuracy of a so-called
nose-to-nose measurement.
Recent
Advances in the Measurement and Black-Box modeling of
High-Frequency
Components
.....
Oct
1994 .....
125 KB
Originally published as an invited paper in the GAAS99
Conference Proceedings, This paper gives an overview
of frequency domain measurement and modeling techniques
for non-linear microwave components. The system
architecture and measurement capabilities of the
Hewlett-Packard "Non-linear Network Measurement System"
are described. Three modeling techniques, based on the
new instrument measured data, are discussed: empirical
models, state-space models and black-box frequency domain
models.
This NMDG Data Sheet discribes the model NM100 VNA+ Large-Signal Network Analysis Extension Kit developed and manufactured by NMDG Engineering and licensed and sold by Maury Microwave. A detailed explaination of how the NM100 VNA+ combines Large-Signal Network Analysis with advanced functions of the Agilent N5230A is provided, along with discussion of the basic system concept, followed by a brief list of LSNA hardware included in the system. A block diagram with discussion of applications and benefits is included, along with overall performance specifications, software options, GUI, scripting language, DLL connectivity and other advanced user features.
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