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Typical
System Setups
Typical
System Setups
Noise
Characterization
On-Wafer Load Pull
Setup Millimeter Wave
On-Wafer U. S. PATENT NO.
5,910,754
The photo at right shows a typical mounting arrangement for two Maury MT982A automated tuners with the device-under-test (DUT) mounted on a test fixture (MT950B2) in preparation for noise characterization of a packaged device in a test fixture.
The photo at right shows a typical mounting arrangement for two Maury MT982A automated tuners mounted on a coaxial probe station in preparation for on-wafer device characterization.
Load Pull Setup
The photo at right shows two Maury MT979A millimeter wave automated tuners (with covers removed for clarity) mounted on a millimeter wave probe station in preparation for on-wafer device characterization.
