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Home < RFDCS Products < MT900N Series Integrated Systems |
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MT900N Series Integrated Systems |
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Description The MT900N family of millimeter-wave device characterization systems was developed to provide customers with a set of state-of-the-art characterization tools for the circuit design methodologies that extract increased performance from a given fabrication process by enhancing transistor operating range and linearity. MT900N millimeter-wave noise parameter and load-pull measurement systems encompass a wide range of high-performance component test tools to address the growing needs of new millimeter-wave appplications including LMDS, WLAN, and automotive anticollision radar. Specific models and added options offer higher levels of measurement capability, including noise parameters, gain compression, harmonic, IMD, output power contours, and many other measurement features, all in addition to fast and accurate S-parameter measurements. Complete measurement solutions to 50, 75, 90, and 110 GHz are available. Turnkey Measurement Systems Maury offers noise parameters and large-signal test systems for both on-wafer and packaged device measurements. Turnkey measurement setups have been developed for V band (50 to 75 GHz), E band (60 to 90 GHz) and W band (75 to 110 GHz). For example, the MT900N15 RF Device Characterization System (shown at right) is a fully integrated on-wafer, S-parameter, noise parameter, and large-signal device characterization sytem built on the Cascade Microtech S300 automated probe station. It is a fully automated system throught GPIB bus, and includes a millimeter-wave Agilent PNA network analyzer, spectrum analyzer, power meter, and noise figure meter in association with a Maury Microwave MT7553M 60-90 GHz noise downconverter, and two Maury MT978A automated tuners. Specific customer needs and specifications can be addressed through customization. Further information is available from our Sales Department.
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