Maury Microwave Corporation
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MW & RF Characterization Solutions Tactical Solutions Precision Calibration Standards Company Overview

RF/Microwave Measurement Services

Available from MAURY MICROWAVE

Maury Microwave is a leading provider of automated tuner systems for making Noise Parameter and Load Pull measurements. As a manufacturer of solid state and mechanical tuner systems, and an innovator of test and measurement technologies, Maury possesses a wide range of measurement systems which are, and which can be, configured to perform a variety of measurements on a number of device topologies.

Now, after decades of working with device designers (PA, LNA), process engineers, device modeling experts in delivering measurement systems and providing system training and measurement expertise, Maury is uniquely positioned to offer device measurement and characterization services to the RF & Microwave industry.

BENEFITS

• Save Time/Save $ - Let us do it for you
• Minimize your test equipment investment
• Enjoy complete confidence in your measurement data through measurement verification

FEATURES

• Fully Integrated and calibrated test systems
• The latest test equipment from leading manufacturers
• Access to expert RF/microwave test and measurement engineers and technicians
• Access to cutting edge methodologies and topologies, and to emerging technological advances

Accurate • Repeatable • Reliable

Maury's device characterization services can help newly formed fabless design houses obtain the accurate and reliable RF measurement data that is crucial to their design work. Maury can also provide measurement verification to those companies that have their own noise parameter and load pull systems, and that want to take an extra step in certifying that their systems' measurement data is accurate, and verifiable. Maury's Measurement Services also be applied to help with device fabrication, model verification, and process control.

Reliable • Cost-effective

Maury's team of expert engineers and measurement technicians use a proven approach to making accurate noise parameter and load pull measurements .Working with the best solid state and mechanical tuner systems in the industry (covering frequencies from 250 MHz to 110 GHz) our team will get you the results you need. In addition to this, Maury's modern lab is equipped with the latest instruments for on-wafer and in-fixture CW and pulse measurement. Our close business alliances with Cascade Microtech and Agilent Technologies ensures that we can bring together a wide array of measurement configurations that is flexible enough to match our customers' changing measurement needs.



All Measurement Services are performed in our Engineering facilities at our Manufacturing Plant.

Call the experts at Maury to discuss your measurement needs.
(909) 987-4715
Services Offered
Measurement Parameters
Measurement Capability
DC-IV IV characteristics on the Ids-Vds plane and the Ids-Vgsplane, including gm, gds, and static BVdss.

Optional subthreshold and Gummel characterization available.

 On-wafer range of ± 100 V and ± 1 A, with ± 10 A pulsed.

In-fixture range of ± 50 V and ± 10 A.
S-Parameter Two-port s-parameter characterization at the user-defined reference plane. On-wafer from 45 MHz to 50 GHz at ± 100 V and ± 1 A.

In-fixture from 45 MHz to several GHz (depending on the fixture used) at ± 50 V and ± 10 A.
Noise Measurements Noise parameter characterization at a user-defined reference plane. On-wafer from 45 MHz to 50 GHz at ± 100 V and ± 1 A.

In-fixture will be considered on a case-by-case basis.
Power Measurements
- Basic Load Pull		 Load pull characterization to establish maximum saturated power, gain, and PAE. On-wafer range of ± 100 V and ± 1 A, up to 35 dBm for typical wireless bands.

In-fixture range of ± 50 V and ± 10 A, up to 150 W for typical wireless bands.

Frequency coverage is 800 MHz to 50 GHz for on-wafer and 400 MHz to 8 GHz for in-fixture (can be increased as fixture used permits).
Power Measurements
- Advanced Load Pull		 Load pull characterization to establish performance under modulation, to optimize ACPR, EVM, and CDP as well as power, gain and PAE. A rigorous optimization of bias and source impedance is done. On-wafer range of ± 100 V and ± 1 A, up to 35 dBm for typical wireless bands.

In-fixture range of ± 50 V and ± 10 A, up to 150 W for typical wireless bands.

Frequency coverage is 800 MHz to 50 GHz for on-wafer and 400 MHz to 8 GHz for in-fixture (can be increased as fixture used permits).
Time-Domain Time-domain and Vector-domain analysis is provided as a complimentary value-add to load pull measurements. Measurement range identical to load pull range. Vector-domain bandwidth limited to 10 MHz.

Measurement data is provided on CD-ROM and in EDA compatible format.